Applications

Gas Analysis

For real time analysis of gases and vapours

QGA A compact bench-top system for real time gas and vapour analysis
HPR-20 QIC R&D A specialist gas analysis system for advanced research
HPR-20 QIC EGA A compact bench-top gas analysis system for evolved gas analysis in TGA-MS
HPR-20 QIC TMS A specialist gas analysis system for fast event transient analysis
QIC BioStream An integrated mass spectrometer for multi-stream, multi reactor fermentation off-gas analysis
QIC MultiStream An integrated mass spectrometer and selector valve system for multi-component, multi-stream gas analysis
HPR-40 DSA Designed for analysis of gases, vapours and VOCs in liquids

Plasma Characterisation

Plasma characterisation, plasma ion analysers and langmuir probes

EQP Analysis of positive and negative ions, neutrals, and radicals
PSM Plasma sampling mass spectrometer
ESPion For measurement of plasma properties
HPR-60 MBMS Molecular beam sampling mass spectrometer for ion and radical analysis

SIMS Surface Analysis and SNMS Surface Analysis

For the determination of surface composition, contaminant analysis and depth profiling

SIMS Workstation For thin film depth profiling
EQS For the analysis of secondary +ve and -ve ions from solid samples
MAXIM A system for static and dynamic SIMS and SNMS applications
IG5C A 5KeV Caesium ion gun for UHV surface analysis
IG20 A 5KeV Argon or Oxygen ion source for UHV surface analysis
FIB-SIMS Add high performance SIMS capability to your existing FIB system

FIB-SIMS for Nano-Scale Materials Analysis

Add high performance SIMS capability to your existing FIB system

FIB-SIMS Add high performance SIMS capability to your existing FIB system
EQS For the analysis of secondary +ve and -ve ions from solid samples

UHV Surface Science

For direct information on gas uptake and for dissolved output rates

EQS For the analysis of secondary +ve and -ve ions from solid samples
SIMS Workstation For thin film depth profiling
EPIC A system for UHV analysis of neutrals, radicals and ions
3F Series 1000 RGA For high precision scientific and process applications
IDP A system for analysis of ions, neutrals and radicals in UHV desorption studies
TPD Workstation For UHV temperature programmed desorption studies

Catalysis

For the determination of surface composition, contaminant analysis and for depth profiling

CATLAB-PCS Automated microreactor/mass spectrometer system
SpaciMS Spatially resolved capillary inlet mass spectrometer
HPR-20 QIC R&D Specialist gas analysis system for advanced research
HPR-20 QIC EGA Gas analysis system for evolved gas analysis in TGA-MS
HPR-20 QIC TMS Transient mass spectrometer for fast event gas analysis
3F-PIC Transient mass spectrometer for fast event UHV studies
HPR-60 MBMS Molecular beam sampling mass spectrometer for ion and radical analysis

Thin Films and Surface Engineering

Plasma characterisation, plasma ion analysers and langmuir probes

HPR-30 Process and residual gas analysis
EQP Analysis of positive and negative ions, neutrals, and radicals
PSM Plasma sampling mass spectrometer
ESPion For measurement of plasma properties
TPD Workstation For UHV temperature programmed desorption studies
SIMS Workstation For thin film depth profiling
IMP-EPD For ion etch control and optimum process quality
XBS MBE deposition flux rate monitor
IG5C A 5KeV Caesium ion gun for UHV surface analysis
IG20 A 5KeV Argon or Oxygen ion source for UHV surface analysis
FIB-SIMS Add high performance SIMS capability to your existing FIB system

Residual Gas Analysis for Vacuum Processing

For process monitoring and leak detection

HPR-30 Process and residual gas analysis
HMT A dual mode RGA system for vacuum diagnostics and process monitoring
3F Series 1000 RGA For high precision scientific and process applications

Thermal Analysis Mass Spectrometer Systems

For evolved gas analysis as a function of time and temperature

CATLAB-PCS Automated microreactor/mass spectrometer system
TPD Workstation For UHV temperature programmed desorption studies
HPR-20 QIC R&D Specialist gas analysis system for advanced research
QGA A compact bench-top system for real time gas and vapour analysis

Nanotechnology

For the determination of surface composition, contaminant analysis and for depth profiling

SIMS Workstation For thin film depth profiling
XBS MBE deposition flux rate monitor
TPD Workstation For UHV temperature programmed desorption studies
HPR-60 MBMS A system for analysis of neutrals, radicals and ions
FIB-SIMS Add high performance SIMS capability to your existing FIB system

Residual Gas Analysis

For routine, fast, wide dynamic range residual gas analysis

RGA Series Systems for the examination of components present in a vessel or evolved from a process
HMT A dual mode RGA system for vacuum diagnostics and process monitoring
3F Series 1000 RGA For high precision scientific and process applications
HPR-30 Process and residual gas analysis

Dissolved Species Analysis

For analysis of respiratory gases, hydrocarbons and sulphides

HPR-40 DSA Membrane inlet mass spectrometer for dissolved species analysis

Molecular Beam Studies

For molecular beam analysis

3F Series 1000 RGA For high precision scientific and process applications
EPIC A system for UHV analysis of neutrals, radicals and ions
HPR-60 MBMS Molecular beam sampling mass spectrometer for ion and radical analysis