SIMS Surface Analysis and SNMS Surface Analysis

Mass spectrometers for vacuum, gas, plasma and surface science

 

SIMS Surface Analysis and SNMS Surface Analysis

For the determination of surface composition, contaminant analysis and depth profiling

Measures the concentration of gases and vapours in real time

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Mass range

200, 300 or 510 amu

Minimum detectable concentration

5 PPB

Maximum detectable concentration

100%

Sample inlet pressure

100mbar to 2bar abs

 

Options for sampling at pressures up to 30Bar

Response time to gas concentration change

300 milliseconds

Fast measurement speed

Up to 500 measurements per second

Sample flow required

Options for < 1 atm cc/min to 20 atm cc/min

 

Corrosive gas sampling options

For the determination of surface composition, contaminant analysis and depth profiling

SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.

Hard Disk

Related Products

SIMS Workstation

EQS

MAXIM

IG5C

IG20

Compact SIMS

Overview

SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.

Applied to analysis within the first few microns of a surface, Hiden's SIMS systems provide depth profiles with depth resolution to 2 nanometres.

The Hiden SIMS Workstation provides for high performance static and dynamic SIMS applications for detailed surface composition analysis and depth profiling.

Hiden's elemental SIMS imaging facility provides for high resolution surface chemical mapping.

Hiden Bolt-On Components are available for upgrading existing surface analysis equipment with SIMS facilities.

 

Overview

SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.

Applied to analysis within the first few microns of a surface, Hiden's SIMS systems provide depth profiles with depth resolution to 2 nanometres.

The Hiden SIMS Workstation provides for high performance static and dynamic SIMS applications for detailed surface composition analysis and depth profiling.

Hiden's elemental SIMS imaging facility provides for high resolution surface chemical mapping.

Hiden Bolt-On Components are available for upgrading existing surface analysis equipment with SIMS facilities.