Secondary ion mass spectrometry(SIMS) is a versatile, highly-sensitive technique for surface analysis and surface depth profiling of diverse materials. Hiden Analytical expands their primary system options to offer the choice of three initial equipment levels to suit a broad spread of budget capacities. All systems offer full UHV operation and expandability to the top-level specification. The dual-mode MAXIM mass spectrometer features operation both in the secondary ion mode and in the secondary neutral(SNMS) quantification mode.

Hiden Analytical issue a new catalogue describing their mass spectrometer systems and microreactors for control and monitoring of diverse gas-related thermal processes. Application areas include catalyst quantification, thermogravimetric analysis(TGA), thermal programmed processes (TPD/TPR/TPO) and general thermal reaction studies, with a range of interfaces available to accommodate process pressures from sub-atmospheric to 30 bar.

The Hiden HPR-60 mass spectrometer is a research tool conceived specifically for direct analysis of ions, radicals and neutral species in reactive processes, and will be of interest to researchers in the fields of plasma and transient chemistry, reaction kinetics, catalytic processes. The system typically operates in pressure regimes from 5 mbar to 5 bar, and mass spectrometer options provide for measurement of neutrals, positive ions, negative ions and ion energies, with choice of mass range up to 2500 amu.

The Hiden IG5C high-brightness caesium ion gun produces an intense beam of caesium ions ideally suited to SIMS depth profiling, surface physics and surface modification for analysis of electronegative elements and MCs+ clusters, where M is the element of interest.

On April 18, 2013 at MIT Lincoln Labs, in the cafeteria, Hiden Analytical will be demonstrating their latest instrument for atmospheric pressure gas analysis studies - the QGA Quantitative Gas Analysis System.

Vacuum processing is an essential element of diverse chemical, metallurgical and electronics-related procedures including vacuum furnacing, chemical vapour deposition, surface etching and evaporative coating, with process pressures ranging from ultrahigh vacuum (UHV) through to millitorr.

The performance of the Hiden family of plasma diagnostic tools is further advanced by integration of on-board timers for real-time pulsed plasma measurement, the fast gating fully controllable within the MASsoft operating program. Two timers provide ‘gate open/close’ and ‘gate increment’ periodicity with sub-microsecond gating resolution to just 100 nanoseconds, phasing data acquisition precisely with each individual plasma pulse.

The Hiden IG20 high-brightness gas ion gun is further enhanced by the introduction of a new beam optic and ion source configuration to enable both increased beam brightness AND beam contrast, together with a significant reduction in ultimate spot size. With a raster scanning area of 4x4 mm the IG20 is equally suited to depth profiling and to surface imaging applications, and is the preferred gas ion gun for secondary ion and secondary neutral mass spectrometry, for Auger and for XPS. Parameter selection and gun operation are fully under PC control, and the gun is operable with both oxygen and with inert gas primary sources.

The Hiden HPR-60 mass spectrometer is a research tool conceived specifically for direct analysis of ions, radicals and neutral species in reactive processes, and will be of interest to researchers in the fields of plasma and transient chemistry, reaction kinetics, catalytic processes. The system typically operates in pressure regimes from 5 mbar to 5 bar, and mass spectrometer options provide for measurement of neutrals, positive ions, negative ions and ion energies, with choice of mass range up to 2500 amu.

The new Overlap Evaluator iPad App from Hiden Analytical is a reference tool for users of mass spectrometers operating in the fields of vacuum science and vacuum processing, and for advanced researchers using real time gas analysis systems.