Home Product Catalogue Surface Science & Materials Analysis
Surface Science & Materials Analysis
SIMSLarge.png

SIMS Workstation, SIMS Analysers and Ion Guns

 

Request Further Information and Pricing...

 
1 EQS, a Secondary Ion Mass Spectrometer bolt on SIMS Analyser.
2 SIMS Workstation , a UHV Surface Analysis System, for thin film depth profiling.
3 Secondary ion mass spectrometer for UHV surface analysis and SNMS. The Hiden MAXIM.
4 IDP Mass Spectrometer for analysis of ions, neutrals and radicals in UHV desorption studies.
5 TPD Workstation for UHV Thermal Desorption Studies
6 Ion-FAB Guns
7 IG20 5 KeV Argon or Oxygen ion source for UHV surface analysis applications.
8 IG5C 5KeV Caesium Ion Source for UHV Surface Analysis applications.
9 IFG200 Fast Atom Bombardment Ion Gun