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Mass spectrometers for vacuum, gas, plasma and surface science

A system for static and dynamic SIMS and SNMS applications

The Hiden MAXIM quadrupole SIMS analyser is a state of the art secondary ion mass spectrometer for positive and negative, static, dynamic and neutral analytical applications.

The MAXIM analyser system includes an integral energy filter for ion acceptance at 30° to the probe axis, high transmission SIMS extraction optics, triple mass filter, pulse ion counting detector and control electronics.

MAXIM

Applications

Catalysis

Surface analysis

Thin film & surface engineering

Surface science

Nanotechnology

Related Products

EQS

IG20

SIMS Workstation

Overview

The 30° acceptance angle allows the MAXIM to be mounted with its axis parallel to the plane of the sample, leaving a clear view of the sampled area for other light or ion optics.  The MAXIM is tolerant of sample charging making it an ideal probe for the analysis of insulators.  Also, large acceptance angle allows for wide area imaging.

Features

- Mass range options: 300amu, 500amu or 1000amu

- Detector: Ion counting detector, Positive and Negative ion detection, 107 cps

- Mass filter: Triple filter

- Pole diameter: 9mm

- Bakeout: 250°C

- Ion energy filter: 30° angular acceptance

- Ioniser: Electron bombardment, single filament for SNMS and RGA

Software

The system is supplied with MASsoft 7 Professional Edition software.

This Windows 8 compatible software allows control of the instrument via USB 2.0, RS232 or Ethernet. Provides comprehensive I/O for data output and for reading data from external devices for integration and display with mass spectrometer data.