Home Product Catalogue Surface Science & Materials Analysis SIMS Workstation with MAXIM Analyser
SIMS Workstation with MAXIM Analyser

A rugged general purpose SIMS and SNMS analysis station

 

  • Rapid turnaround of all types of samples
  • Static and dynamic SIMS
  • Integral ioniser for SNMS and RGA
  • Choice of Ion guns
  • SNMS surface mapping / imaging
  • Surface contamination analysis
  • Quantification of matrix level by SNMS
  • Flexible and upgradeable configuration
  • Low cost of ownership

 

The Hiden SIMS Workstation, an integrated UHV / SIMS facility for advanced surface analysis, featuring:

 

  • Hiden MAXIM SIMS analyser operating under MASsoft for ppb analysis.
  • Intergrated ioniser for efficient SNMS analysis.
  • Choice of differentially pumped Hiden IG20 Gas, IG-5C Caesium, IFG200 FAB or high performance liquid gallium guns as primary excitation source.
  • Integral ion gun raster control with signal gating for depth profiling.
  • Electron flood gun option for charge neutralisation in insulator studies.
  • Vacuum chamber bakeout heaters.
  • Fast sample transfer, sample holder and manipulator with load lock.
  • UHV manipulator for optimum sample positioning.
  • SIMS elemental imaging option with ESM LabVIEW SIMS Imaging program.
  • Static SIMS Spectral Library available.
  • Automatic SIMS ion optics lens tuning, and automatic mass alignment for optimum SIMS performance.

 

 

Brochures

 

icon SIMS - Secondary Ion Mass Spectrometers (1676K)

iconTour of the Hiden SIMS Workstation (6215K)

 

 

 

 

Application Notes

 

icon Secondary Ion Mass Spectrometry - Glass Coatings (30K)

icon Secondary Neutrals Analysis (301K)

icon SIMS - Imaging of Semiconductor Contact Pads (493K)

icon SNMS - Depth Profile of Hard Drive Platter (560K)

icon Sputtered Neutral Mass Spectrometry - Magnetic Layers (89K)

icon Tour of the Hiden SIMS Workstation (6215K)

 

 

Gallery