|
A rugged general purpose SIMS and SNMS analysis station | - Rapid turnaround of all types of samples
- Static and dynamic SIMS
- Integral ioniser for SNMS and RGA
- Choice of Ion guns
- SNMS surface mapping / imaging
- Surface contamination analysis
- Quantification of matrix level by SNMS
- Flexible and upgradeable configuration
- Low cost of ownership
|
The Hiden SIMS Workstation, an integrated UHV / SIMS facility for advanced surface analysis, featuring: - Hiden MAXIM SIMS analyser operating under MASsoft for ppb analysis.
- Intergrated ioniser for efficient SNMS analysis.
- Choice of differentially pumped Hiden IG20 Gas, IG-5C Caesium, IFG200 FAB or high performance liquid gallium guns as primary excitation source.
- Integral ion gun raster control with signal gating for depth profiling.
- Electron flood gun option for charge neutralisation in insulator studies.
- Vacuum chamber bakeout heaters.
- Fast sample transfer, sample holder and manipulator with load lock.
- UHV manipulator for optimum sample positioning.
- SIMS elemental imaging option with ESM LabVIEW SIMS Imaging program.
- Static SIMS Spectral Library available.
- Automatic SIMS ion optics lens tuning, and automatic mass alignment for optimum SIMS performance.
Brochures SIMS - Secondary Ion Mass Spectrometers (1676K)
Tour of the Hiden SIMS Workstation (6215K)

Application Notes Secondary Ion Mass Spectrometry - Glass Coatings (30K)
Secondary Neutrals Analysis (301K)
SIMS - Imaging of Semiconductor Contact Pads (493K)
SNMS - Depth Profile of Hard Drive Platter (560K)
Sputtered Neutral Mass Spectrometry - Magnetic Layers (89K)
Tour of the Hiden SIMS Workstation (6215K)
Gallery    
   
 
|