Home Product Catalogue Surface Science & Materials Analysis IFG200 Fast Atom Bombardment Ion Gun
IFG200 Fast Atom Bombardment Ion Gun

State of the art FAB / ion gun for surface and depth analysis applications

 

  • Static and Dynamic SIMS Studies
  • Auger Electron Spectroscopy
  • Ion Beam Sputtering
  • FAB/SIMS studies of insulators
  • Surface Science Studies
  • Rastering / Depth Profiling

 

The Hiden IFG200 Fast Atom Bombardment / Ion Gun for static and dynamic SIMS, featuring:

 

  • 2mm atom or ion beam at energies from 0.5 – 5 keV.
  • Charge exchange chamber for ion ® fast atom conversion for FAB studies.
  • Electrostatic deflection lens for clean FAB beam.
  • High current density and stable positioning.
  • 3° offset in the ion gun column for optimum rejection of neutrals in ion beam mode.
  • Inert gas and Oxygen capability.
  • Differentially pumped source region.
  • Easily replaceable twin filament assembly.
  • Control unit fully compatible with IG20 high-brightness ion gun.
  • Integrated operation with SIM and EQS probes for direct raster rate / area control.

 

 

Brochures

 

icon SIMS - Secondary Ion Mass Spectrometers (1676K)

 

 

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