Mass spectrometers for vacuum, gas, plasma and surface science

SIMS Surface Analysis and SNMS Surface Analysis

For the determination of surface composition, contaminant analysis and depth profiling

SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.

Hard Disk

Related Products

SIMS Workstation

EQS

MAXIM

IG5C

IG20

Compact SIMS

Overview

SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.

Applied to analysis within the first few microns of a surface, Hiden's SIMS systems provide depth profiles with depth resolution to 2 nanometres.

The Hiden SIMS Workstation provides for high performance static and dynamic SIMS applications for detailed surface composition analysis and depth profiling.

Hiden's elemental SIMS imaging facility provides for high resolution surface chemical mapping.

Hiden Bolt-On Components are available for upgrading existing surface analysis equipment with SIMS facilities.