SIMS and SNMS
FIB-SIMS is a very powerful surface analytical technique that is rapidly gaining popularity in high sensitivity nano-scale materials analysis. Here we demonstrate that the Hiden EQS, when fitted to a FIB-SEM, is highly capable of carrying out the larger (micron)-scale depth profile analyses that are usually the domain of its standalone counterpart.
Worldwide vehicle ownership is predicted to exceed 2 billion vehicles by 2030, with cars and vans responsible for around 45% of global CO2 emissions from the transport sector. This has resulted in a significant drive within the automotive sector to mitigate the environmental impact from our vehicles of the future.
AP0088 - Metal-Carbon Composites and Multilayer Thin Films Prepared by Plasma Assisted Sequential...
Thin films incorporating mixed metal and carbon elements (like carbon-metal nanocomposites or multilayer thin films) find applications as functional coatings in many fields of modern technology. A novel plasma assisted deposition method (namely sequential deposition), combining magnetron sputtering (MS) and plasma enhanced chemical vapor deposition (PECVD) was implemented. Using the same deposition setup, the sequential deposition method proved to be able in producing either a-C:H/W nanocomposite or carbon tungsten multilayers.
Poster describing the new surface analysis method: