SIMS

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Towards an Understanding of MCs+n Formation Mechanism in SIMS 1.94 MB

Towards an understanding of MCs+n formation mechanism in SIMS. ...
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Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization... 330.25 KB

Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization...
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Surface Analysis by Secondary-Ion Mass Spectroscopy During Etching with Gas-Cluster Ion Beam 153.58 KB

Surface analysis by secondary-ion mass spectroscopy during etching with gas-cluster...
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Sputter Depth Profiling by Secondary Ion Mass Spectrometry Coupled with Sample Current... 613.21 KB

Sputter depth profiling by secondary ion mass spectrometry coupled with sample current...
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Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS and... 109.76 KB

Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS...
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Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective 1.94 MB

Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective. ...
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Plasma Implanted Ultra Shallow Junction Boron Depth Profiles: Effect of Plasma Chemistry... 618.05 KB

Plasma implanted ultra shallow junction boron depth profiles: Effect of plasma chemistry...
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Mass-Resolved Ion Scattering Spectrometry for Characterization of Samples with Historical... 200.29 KB

Mass-resolved ion scattering spectrometry for characterization of samples with historical...
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Interfacial Diffusion in a Double Quantum Well Structure 1.94 MB

Interfacial diffusion in a double quantum well structure. ...
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Interface-Dominated Growth of a Metastable Novel Alloy Phase 1.94 MB

Interface-dominated Growth of a Metastable Novel Alloy Phase. ...