New Compact SIMS at 61st AVS | Visit us on Booth 311

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Create Date4th October 2016

Hiden is pleased to announce they will be exhibiting the New Compact SIMS, a design breakthrough for surface analysis, at 61st AVS 9-14 November 2014, Baltimore MD, USA. Visit us on Booth 311. The Compact SIMS tool is designed for fast and easy characterisation of layer structures, surface contamination and impurities with sensitive detection of positive ions being assisted by the oxygen primary ion beam and provides isotopic sensitivity across the entire periodic table.