|File Size||520.35 KB|
|Create Date||4th October 2016|
Hiden is pleased to announce they will be exhibiting the New Compact SIMS, a design breakthrough for surface analysis, at ARABLAB 2015, 23rd - 26th March, Dubai UAE. Visit us on Booth 1011. The Compact SIMS tool is designed for fast and easy characterisation of layer structures, surface contamination and impurities with sensitive detection of positive ions being assisted by the oxygen primary ion beam and provides isotopic sensitivity across the entire periodic table.