New SIMS Workstation Brochure from Hiden Analytical


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Create Date4th October 2016
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Hiden Analytical release their new brochure detailing the latest features of the SIMS/SNMS Workstation for high-sensitivity static and dynamic surface analysis. Applicable technologies range from photovoltaics, metallurgy, semiconductors and thin-film studies through to geology and gem-stone characterisation.