Hiden Analytical, a leading innovator in materials and gas analysis, is proud to announce an important development of the SIMS Workstation family of instruments, the Dual Polarity Simultaneous Detector.
Secondary Ion Mass Spectrometry, SIMS, is a surface analysis method using a beam of energetic ions to erode the surface, with almost atomic layer precision. It is highly sensitive and is used in the semiconductor, glass coating and thin layer deposition industries for product development and monitoring, often with sub ppm sensitivity.
In use, the material ejected from the sample by an incident ion beam becomes charged, either positive or negative depending on its chemistry. To make a full analysis two runs normally have to be made, one for each polarity. However, the latest development from Hiden Analytical enables both to be collected in a single measurement, reducing the overall analysis time and improving accuracy.
In highly complex samples, such as CIGS flexible solar cells, the dual polarity method will provide significantly more information, especially in failure analysis where a single defect needs to be measured in both positive and negative ion modes.
Dr Graham Cooke, Principal Scientist at Hiden Analytical commented, “this really is a game-changing development for thin film measurement and puts SIMS, and Hiden, at the forefront of cost-effective materials analysis.”
For more information, please visit our website at hidenanalytical.com/dual-polarity-sims-workstation or contact our sales team at .
About Hiden Analytical
Hiden Analytical has been designing and developing mass spectrometer-based gas analysis systems since 1981. Known for delivering high-quality instruments with exceptional sensitivity and accuracy, Hiden Analytical serves a global market with a robust service and support network, addressing a broad range of applications in gas analysis, surface analysis, plasma diagnostics, and vacuum analysis.
