Scientific Instrument and Equipment Design, Development

and Manufacturing from Hiden Analytical

 

Quadrupole Mass Spectrometers for Vacuum, Gas, Plasma and Surface Science

 

Press Release
Press Release - SIMS System Family Trio from Hiden
Secondary ion mass spectrometry(SIMS) is a versatile, highly-sensitive technique for surface analysis and surface depth profiling of diverse materials. Hiden Analytical expands their primary system options to offer the choice of three initial equipment levels to suit a broad spread of budget capacities. Read more...

 

Press Release
Recent Events - MIT Lincoln Labs Demonstration
Hiden Analytical were delighted to have the opportunity to visit MIT Lincoln Laboratory (@MITLL) this week to showcase our range of precision quadrupole mass spectrometers. Mike Grandinetti of IES Tech Sales (Hiden Analytical’s local representative), and Mark Buckley from the Michigan Application Center were on-site. Read more...

 

Press Release
Press Release - MIT Lincoln Labs Demonstration
On April 18, 2013 at MIT Lincoln Labs, in the cafeteria, Hiden Analytical will be demonstrating their latest instrument for atmospheric pressure gas analysis studies - the QGA Quantitative Gas Analysis System. Read more...

 

Languages
Multi-lingual Product Catalogue
View descriptions of our product ranges in a variety of languages and request more information from a local representative. Read more...

 

Hiden Isochema
Hiden Isochema
Hiden Isochema is a world leader in the design and manufacture of sorption instruments for research, development and production applications in surface chemistry and materials science. Read more...

 

Product Overview: from Surface Science to Quadrupole Mass Spectrometers

Hiden Analytical is a leading manufacturer of quadrupole mass spectrometers for gas analysis, plasma characterisation and both research and for process engineering and surface science. The product range includes:

 

For ultra-high vacuum research:

 

Triple filter quadrupole mass spectrometers including:

 

  • 3F series RGA systems
  • PIC series with fast, high-sensitivity pulse ion counting detection
  • EPIC series with pulse ion counting detection and pole bias control for positive and negative ion analysis
  • MAXIM, a secondary ion mass spectrometer for UHV surface analysis and SNMS
  • EQS SIMS probe, secondary ion mass spectrometer bolt on SIMS analyser
  • IG20 ion gun
  • IG5C caesium ion gun

 

For ultra-high vacuum through to sub-atmospheric process applications:

 

  • HAL multifunction RGA Series
  • HMT high pressure RGA process monitor
  • HPR 30 differentially pumped system for operation to 5 mbar
  • HPR 50 CVD diamond process analyser
  • HPR 80 quantitative vacuum process gas analyser for reactive/corrosive species
  • XBS flux rate control monitor for MBE
  • IMP end-point detectors for ion-beam etch and reactive ion-beam etch end point control
  • PSM plasma ion mass and energy analyser for plasma characterisation
  • EQP plasma ion mass and energy analyser for plasma characterisation

 

Laboratory gas analysers:

 

  • QIC Series laboratory style gas/vapour analysers
  • QIC Biostream, hydra multi-stream gas/vapour analyser
  • HPR 70 batch gas inlet system for gas analysis of discrete samples
  • HPR 90 sealed package gas analyser with integral package cracker

 

Research-grade gas analysers:

 

  • HPR 20 QIC Plus system with integrated calibration gas generation - gas analyser
  • HPR 40 dissolved species analyser - membrane inlet mass spectrometer - MIMS
  • HPR 60 molecular beam sampling mass spectrometer for atmospheric plasma analysis, gas analysis and gas reaction kinetics studies - MBMS
  • CATLAB integrated gas analyser and microreactor for catalyst characterisation

 

UHV surface analysis:

- SIMS secondary ion mass spectrometer
- UHV temperature programmed desorption analysis system

 

  • SIMS Workstation - A complete UHV surface analysis system
  • MAXIM, a secondary ion mass spectrometer for UHV surface analysis and SNMS
  • EQS SIMS probe, secondary ion mass spectrometer bolt on SIMS analyser
  • IDP quadrupole mass spectrometer for electron and photon stimulated desorption
  • IG20 ion gun
  • IG5C caesium ion gun
  • IFG200 FAB fast atom bombardment ion gun
  • TPD Workstation - A system for UHV temperature programmed desorption

 

Catalyst Characterisation - Thermal Analysis TA-MS:

 

  • CATLAB integrated gas analyser and microreactor for catalyst characterisation
  • SPACI MS 3D catalyst characterisation system
  • HPR 20 QIC R&D - A specialist gas analysis system for advanced research
  • HPR 20 QIC TNS - A specialist gas analysis system for fast event transient analysis
  • HPR 20 QIC EGA - A gas analysis system for evolved gas analysis

 

Plasma diagnostics and plasma characterisation - Ions - Neutrals - Radicals:

 

  • EQP plasma ion mass and energy analyser for plasma characterisation
  • PSM plasma ion mass and energy analyser for plasma characterisation
  • ESPion advanced langmuir probe for plasma diagnostics
  • ICP plasma reactor with integrated plasma diagnostics
.