SIMS Surface Analysis and SNMS Surface Analysis
For further information and pricing, please get in touch with us.
For the determination of surface composition, contaminant analysis and depth profiling
SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.
Related Products
SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.
Applied to analysis within the first few microns of a surface, Hiden’s SIMS systems provide depth profiles with depth resolution to 2 nanometres.
The Hiden SIMS Workstation provides for high performance static and dynamic SIMS applications for detailed surface composition analysis and depth profiling.
Hiden’s elemental SIMS imaging facility provides for high resolution surface chemical mapping.
Hiden Bolt-On Components are available for upgrading existing surface analysis equipment with SIMS facilities.
Find Out More
Hiden Analytical Ltd and its related companies recognize the importance of protecting the information collected from users in the operation of this website, and take reasonable steps to maintain the security, integrity and privacy of any information in accordance with our Privacy and Data Protection Policy. By submitting information to Hiden you consent to the practices described here in our privacy policy statement.