Detection of lithium using SIMS on FIB microscope
The EQS spectrometer provides SIMS detection for focusedion beam (FIB) microscopes, with excellent sensitivity for light elements (sub ppm sensitivity for lithium).
Additionally, isotopically pure materials can be used for diffusion studies.
SIMS of cathode 7Li mass resolved SIMS image of the cathode surface showing a distinct lithium rich area (research of Hochschule Aalen).
Hiden EQS on Zeiss Crossbeam 340.
Lithium battery analysis The Micrograph shows a 50μm field of view of a cathode surface.
SEM imaging of an aged battery cathode shows bright regions.
SIMS imaging of this region shows the bright areas to be lithium rich.
FIB – SIMS | Focussed Ion Beam Secondary Ion Mass Spectrometry
Hiden Compact SIMS Mass Spectrometry in solid material
Hiden SIMS | Analytical Secondary Ion Mass Spectrometry Products
Low Energy Ne Scattering from Metal Surfaces using MARISS
High Five: UHV SIMS with Plasma Primary & Simultaneous Positive and Negative Secondary Ion Detection
Contaminant Analysis with Hiden Surface Analyzers
What is Surface Interface Analysis?
Mass Spectrometers for Silicon Semiconductor Analysis
Surface Analysis Products from Hiden Analytical
How to Analyse the Top Nano Layers of a Material
Key Contaminant Analysis Techniques