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Products for Nanotechnology

Hiden Analytical supplies industry-leading quadrupole mass spectrometers that make cutting-edge nanotechnology applications possible, from atomic scale surface analysis to ultra-precision vacuum diagnostics. Here you will find a comprehensive list of our mass spectrometry products for the determination of surface composition, contaminant analysis and for depth profiling.

SIMS/SNMS Workstation

The SIMS Workstation combines dynamic and static SIMS analysis with a dual-mode mass spectrometer for positive (+ve) and negative (-ve) ion detection, and an additional secondary neutral mass spectrometry (SNMS) detection mode, for superior flexibility in surface analysis applications.

HPR-60 MBMS

HPR-60 MBMS

The HPR-60 MBMS (molecular beam mass spectrometer) is optimised for the analysis of both positive (+ve) and negative (-ve) ions, as well as neutral and radicals, making it a robust solution for plasma and combustion analysis.

XBS

A system for multiple source monitoring in MBE deposition applications. For molecular beam analysis and deposition rate control.

TPD Workstation

A system for UHV temperature programmed desorption (TPD/TDS) studies.

FIB-SIMS

High-performance bolt-on secondary ion mass spectrometry (SIMS) for existing focused ion beam (FIB) systems.

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+44(0) 1925 445225