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SIMS Surface Analysis and SNMS Surface Analysis

For further information and pricing, please get in touch with us.

For the determination of surface composition, contaminant analysis and depth profiling

SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.

Overview

SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.

Applied to analysis within the first few microns of a surface, Hiden’s SIMS systems provide depth profiles with depth resolution to 2 nanometres.

The Hiden SIMS Workstation provides for high performance static and dynamic SIMS applications for detailed surface composition analysis and depth profiling.

Hiden’s elemental SIMS imaging facility provides for high resolution surface chemical mapping.

Hiden Bolt-On Components are available for upgrading existing surface analysis equipment with SIMS facilities.

Further Reading

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End point detection in ion beam milling of YB2 Cu3 07 thin films. 4.15 MB 52 downloads

End point detection in ion beam milling of YB2 Cu3 07 thin films. ...
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Dependence of scattered ion yield on the incident energy: Ne+ on pure gallium and indium. 252.94 KB 51 downloads

Dependence of scattered ion yield on the incident energy: Ne+ on pure gallium and...
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Combustion Synthesis of Triangular and Multifunctional ZnON (x # 0.15) Materials. 1.36 MB 51 downloads

Combustion Synthesis of Triangular and Multifunctional ZnON (x # 0.15) Materials. ...
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Characterization of TiO2 coatings prepared by a modified electric arc-physical vapour deposition system. 1.03 MB 56 downloads

Characterization of TiO2 coatings prepared by a modified electric arc-physical vapour...
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Application of Mass Resolved Ion Scattering, Secondary Ion Mass Spectrometry and Sample-Current Measurements for In Situ Depth Profiling of Thin Films. 4.15 MB 52 downloads

Application of Mass Resolved Ion Scattering, Secondary Ion Mass Spectrometry and...