Application of Mass Resolved Ion Scattering, Secondary Ion Mass Spectrometry and Sample-Current Measurements for In Situ Depth Profiling of Thin Films.

Aug 25, 2016

[featured_image]

Download

Download is available until [expire_date]

Version
Download 67
File Size 4.15 MB
File Count 1
Create Date August 25, 2016
Last Updated January 20, 2022

Application of Mass Resolved Ion Scattering, Secondary Ion Mass Spectrometry and Sample-Current Measurements for In Situ Depth Profiling of Thin Films.

Privacy Overview

This website uses cookies to improve your experience while you navigate through the website. Out of these cookies, the cookies that are categorized as necessary are stored on your browser as they are essential for the working of basic functionalities of the website. We also use third-party cookies that help us analyze and understand how you use this website. These cookies will be stored in your browser only with your consent. You also have the option to opt-out of these cookies. But opting out of some of these cookies may have an effect on your browsing experience.

Necessary

Always Enabled

Functional

Performance

Analytics

Analytical cookies are used to understand how visitors interact with the website. These cookies help provide information on metrics the number of visitors, bounce rate, traffic source, etc.

Cookie	Duration	Description
_ga	2 years	The _ga cookie, installed by Google Analytics, calculates visitor, session and campaign data and also keeps track of site usage for the site's analytics report. The cookie stores information anonymously and assigns a randomly generated number to recognize unique visitors.
_gat_gtag_UA_536800_1	1 minute	Set by Google to distinguish users.
_gat_gtag_UA_66706194_1	1 minute	Set by Google to distinguish users.
_gid	1 day	Installed by Google Analytics, _gid cookie stores information on how visitors use a website, while also creating an analytics report of the website's performance. Some of the data that are collected include the number of visitors, their source, and the pages they visit anonymously.
CONSENT	2 years	YouTube sets this cookie via embedded youtube-videos and registers anonymous statistical data.

Advertisement cookies are used to provide visitors with relevant ads and marketing campaigns. These cookies track visitors across websites and collect information to provide customized ads.

Cookie	Duration	Description
_fbp	3 months	This cookie is set by Facebook to display advertisements when either on Facebook or on a digital platform powered by Facebook advertising, after visiting the website.
fr	3 months	Facebook sets this cookie to show relevant advertisements to users by tracking user behaviour across the web, on sites that have Facebook pixel or Facebook social plugin.
VISITOR_INFO1_LIVE	5 months 27 days	A cookie set by YouTube to measure bandwidth that determines whether the user gets the new or old player interface.
YSC	session	YSC cookie is set by Youtube and is used to track the views of embedded videos on Youtube pages.
yt-remote-connected-devices	never	YouTube sets this cookie to store the video preferences of the user using embedded YouTube video.
yt-remote-device-id	never	YouTube sets this cookie to store the video preferences of the user using embedded YouTube video.
yt.innertube::nextId	never	This cookie, set by YouTube, registers a unique ID to store data on what videos from YouTube the user has seen.
yt.innertube::requests	never	This cookie, set by YouTube, registers a unique ID to store data on what videos from YouTube the user has seen.

Others

Application of Mass Resolved Ion Scattering, Secondary Ion Mass Spectrometry and Sample-Current Measurements for In Situ Depth Profiling of Thin Films.

Application of Mass Resolved Ion Scattering, Secondary Ion Mass Spectrometry and Sample-Current Measurements for In Situ Depth Profiling of Thin Films.

Privacy Settings