fbpx
Select Page

SIMS Surface Analysis and SNMS Surface Analysis

For further information and pricing, please get in touch with us.

For the determination of surface composition, contaminant analysis and depth profiling

SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.

Overview

SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.

Applied to analysis within the first few microns of a surface, Hiden’s SIMS systems provide depth profiles with depth resolution to 2 nanometres.

The Hiden SIMS Workstation provides for high performance static and dynamic SIMS applications for detailed surface composition analysis and depth profiling.

Hiden’s elemental SIMS imaging facility provides for high resolution surface chemical mapping.

Hiden Bolt-On Components are available for upgrading existing surface analysis equipment with SIMS facilities.

Further Reading

Icon

MCsn +-SIMS: an innovative approach for direct compositional analysis of materials without standards 48.00 KB 0 downloads

MCsn +-SIMS: an innovative approach for direct compositional analysis of materials...
Icon

Inelastic ion-surface collisions: Understanding secondary emission of molecular ions 48.00 KB 0 downloads

Inelastic ion-surface collisions: Understanding secondary emission of molecular ions ...
Icon

Electronic Structure and Catalytic Study of Solid Solutions of GaN in ZnO 48.00 KB 0 downloads

Electronic Structure and Catalytic Study of Solid Solutions of GaN in ZnO ...
Icon

Towards an Understanding of MCs+n Formation Mechanism in SIMS 1.94 MB 75 downloads

Towards an understanding of MCs+n formation mechanism in SIMS. ...
Icon

Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization... 330.25 KB 56 downloads

Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization...
Icon

Surface Analysis by Secondary-Ion Mass Spectroscopy During Etching with Gas-Cluster Ion Beam 153.58 KB 68 downloads

Surface analysis by secondary-ion mass spectroscopy during etching with gas-cluster...
Icon

Sputter Depth Profiling by Secondary Ion Mass Spectrometry Coupled with Sample Current... 613.21 KB 61 downloads

Sputter depth profiling by secondary ion mass spectrometry coupled with sample current...
Icon

Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS and... 109.76 KB 56 downloads

Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS...
Icon

Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective 1.94 MB 60 downloads

Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective. ...
Icon

Plasma Implanted Ultra Shallow Junction Boron Depth Profiles: Effect of Plasma Chemistry... 618.05 KB 63 downloads

Plasma implanted ultra shallow junction boron depth profiles: Effect of plasma chemistry...