SIMS Surface Analysis and SNMS Surface Analysis
For the determination of surface composition, contaminant analysis and depth profiling
SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.
Related Products
Applied to analysis within the first few microns of a surface, Hiden’s SIMS systems provide depth profiles with depth resolution to 2 nanometres.
The Hiden SIMS Workstation provides for high performance static and dynamic SIMS applications for detailed surface composition analysis and depth profiling.
Hiden’s elemental SIMS imaging facility provides for high resolution surface chemical mapping.
Hiden Bolt-On Components are available for upgrading existing surface analysis equipment with SIMS facilities.
FIB – SIMS | Focussed Ion Beam Secondary Ion Mass Spectrometry
Hiden Compact SIMS Mass Spectrometry in solid material
Hiden SIMS | Analytical Secondary Ion Mass Spectrometry Products
Low Energy Ne Scattering from Metal Surfaces using MARISS
High Five: UHV SIMS with Plasma Primary & Simultaneous Positive and Negative Secondary Ion Detection
What is Sputtered Neutral Mass Spectrometry (SNMS)?
Using SIMS to Determine Isotopic Compositions
Why is SIMS good for Tribofilm analysis?
Why Use SIMS Imaging for Depth Profiling
How Secondary Ion Mass Spectrometry Compares to SEM, TEM, and AFM
What is SIMS Surface Analysis?
Contaminant Analysis with Hiden Surface Analyzers
What is Surface Interface Analysis?
Mass Spectrometers for Silicon Semiconductor Analysis
Surface Analysis Products from Hiden Analytical
How to Analyse the Top Nano Layers of a Material
Interface-Dominated Growth of a Metastable Novel Alloy Phase 1.94 MB 41 downloads
Interface-dominated Growth of a Metastable Novel Alloy Phase. ...
Instantaneous Surface Work Function Dependence of MCs+n Molecular Ion Emission Under... 1.94 MB 37 downloads
Instantaneous surface work function dependence of MCs+n molecular ion emission under...
Optimisation of the connection between TA-MS systems together with improved data interpretation for TA-MS applications. 1.98 MB 42 downloads
Optimisation of the connection between TA-MS systems together with improved data...
High-temperature oxidation of CrN/AlN multilayer coatings. 605.40 KB 32 downloads
High-temperature oxidation of CrN/AlN multilayer coatings. ...
Formation of a tetragonal Cu3Au alloy at gold/copper interfaces. 1.94 MB 32 downloads
Formation of a tetragonal Cu3Au alloy at gold/copper interfaces. ...
Evidence of multiple H+ ion desorption pathways with ESD of chemisorbed and multilayer water. 2.35 MB 37 downloads
Evidence of multiple H+ ion desorption pathways with ESD of chemisorbed and multilayer...
Energy distributions of Ga+ and In+ secondary ions sputtered from AIIIBV compound semiconductors by noble gas ions: Mass-dependence of the high-energy yield on the second component (P, As, Sb) of the compounds. 133.85 KB 31 downloads
Energy distributions of Ga+ and In+ secondary ions sputtered from AIIIBV compound...
Energetics of MCsn+ molecular ions emitted from Cs+ irradiated surfaces. 207.58 KB 37 downloads
Energetics of MCsn+ molecular ions emitted from Cs+ irradiated surfaces. ...
End point detection in ion beam milling of YB2 Cu3 07 thin films. 4.15 MB 36 downloads
End point detection in ion beam milling of YB2 Cu3 07 thin films. ...
