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Solar Voltaics

Algae Studies
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Solar voltaics, a cornerstone of renewable energy, are transforming the way we harness the sun’s power.

As demand for more efficient and durable solar panels grows, the importance of advanced materials analysis in the development of photovoltaic layers cannot be overstated. At Hiden Analytical, we provide state-of-the-art technologies that are pivotal in enabling breakthroughs in solar cell efficiency and longevity, including both Secondary Ion Mass Spectrometry (SIMS) and Thermal Desorption Spectrometry (TDS).

Overview

SIMS Technology for Photovoltaic Analysis

Our SIMS range, including the cutting-edge SIMS workstation and the FIB-SIMS system, stands at the forefront of photovoltaic research and development. These tools offer unparalleled insights into the composition and structure of photovoltaic materials, paving the way for enhanced solar cell performance.

SIMS Workstation: A Core Tool for Photovoltaic Analysis
The SIMS workstation is designed for comprehensive analysis of photovoltaic layers, providing essential data on material composition and impurity distribution. Its precision allows researchers to optimise the fabrication processes of solar cells, ensuring maximum efficiency and performance.

FIB-SIMS System: Advanced Imaging for Solar Materials
Our FIB-SIMS system combines focused ion beam (FIB) technology with SIMS analysis, offering high-resolution SIMS imaging and depth profiling of photovoltaic materials. This system is crucial for understanding the microstructural properties that influence solar cell behaviour and efficiency.

TDSLab Series for Photovoltaic Research

The TDSLab Series brings advanced thermal desorption spectrometry to the forefront of photovoltaic research. These systems enable comprehensive analysis of material properties, crucial for optimizing photovoltaic cell efficiency and durability.

Applications in Solar Voltaics Research:

  • Material Purity and Composition: Identifying and quantifying impurities in photovoltaic materials to enhance cell efficiency.
  • Layer Thickness and Uniformity: Providing accurate measurements and insights to optimize deposition processes.
  • Desorption Studies: Understanding the desorption properties of photovoltaic layers to improve material stability and performance.
  • Gas Analysis: Analysing gases desorbed from photovoltaic materials to optimize manufacturing processes and material selection.

 Why SIMS and TDS Analysis are Indispensable for Solar Energy Progress

The depth of information provided by SIMS and TDS analyses is unparalleled, offering a detailed understanding of photovoltaic materials at the atomic and molecular levels. These insights are crucial for pushing the boundaries of solar cell efficiency, making solar energy more accessible and impactful worldwide.

Further Reading

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MCsn +-SIMS: an innovative approach for direct compositional analysis of materials without standards 48.00 KB 0 downloads

MCsn +-SIMS: an innovative approach for direct compositional analysis of materials...
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Inelastic ion-surface collisions: Understanding secondary emission of molecular ions 48.00 KB 0 downloads

Inelastic ion-surface collisions: Understanding secondary emission of molecular ions ...
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Electronic Structure and Catalytic Study of Solid Solutions of GaN in ZnO 48.00 KB 0 downloads

Electronic Structure and Catalytic Study of Solid Solutions of GaN in ZnO ...
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Towards an Understanding of MCs+n Formation Mechanism in SIMS 1.94 MB 81 downloads

Towards an understanding of MCs+n formation mechanism in SIMS. ...
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Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization... 330.25 KB 61 downloads

Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization...
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Surface Analysis by Secondary-Ion Mass Spectroscopy During Etching with Gas-Cluster Ion Beam 153.58 KB 74 downloads

Surface analysis by secondary-ion mass spectroscopy during etching with gas-cluster...
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Sputter Depth Profiling by Secondary Ion Mass Spectrometry Coupled with Sample Current... 613.21 KB 66 downloads

Sputter depth profiling by secondary ion mass spectrometry coupled with sample current...
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Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS and... 109.76 KB 61 downloads

Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS...
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Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective 1.94 MB 65 downloads

Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective. ...
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Plasma Implanted Ultra Shallow Junction Boron Depth Profiles: Effect of Plasma Chemistry... 618.05 KB 69 downloads

Plasma implanted ultra shallow junction boron depth profiles: Effect of plasma chemistry...
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