Customer Research Review Issue 1120/12 UHV Surface Science

In this issue :

Customer Research

Reactions of ethanol on Ru(0001). Project Summary by: J. M. Sturm, Materials innovation institute M2i

Challenges and prospects for developing CdS/CdTe substrate
solar cells on Mo foils. Project Summary by: Benjamin L. Williams, Eindhoven University of Technology

Electron attachment to a model peptide, N-methylformamide. Project Summary by: M. Michele Dawley & Sylwia Ptasińska, University of Notre Dame

Chasing Stardust. Project Summary by: Prof Martin McCoustra & Alexander Rosu-Finsen, Heriot Watt University

Products Referenced in this Issue

3F PIC – for Fast Event Studies. Hiden’s 3F PIC Series Quadrupoles are high precision triple filter analysers with digital, detectors for ultimate sensitivity and time resolution in UHV TPD applications: UHV TPD, Surface Science, Single Crystal Studies, Molecular Beam Studies, Flash Desorption Analysis, High Performance RGA, Outgassing Studies, Desorption Studies, Bakeout cycles, Process Contaminants

IDP – for analysis of ions, neutrals and radicals in UHV desorption studies. The Hiden IDP is for the direct analysis of low energy ions from UHV surface science techniques. Applications include electron stimulated desorption, photon stimulated desorption and thermal desorption studies: Surface Science
Catalysis, Photon & Electron, Stimulated Desorption Studies, UHV TPD
Molecular Beam Studies, Thin Film & Surface Engineering

EQS – Bolt on SIMS Analyser. The EQS is a secondary ion mass spectrometer bolt on SIMS analyser for the analysis of secondary positive and negative ions from solid samples: Static/Dynamic SIMS with Energy Analysis, Integral Front End Ioniser for RGA, Composition/Contamination Analysis, Depth Profiling
Leak Detection & Desorbed Gas Analysis, Compatible with Hiden SIMS Workstation, Suitable for FIB-SIMS Integration

In the Press

AutoSIMS Automatic Surface Analysis System. The AutoSIMS represents the sum of a combination of instrument developments undertaken for a range of customers. The result is an easy to use general purpose laboratory tool that can undertake routine surface analysis measurements for product monitoring, failure analysis and verification tasks. Based around the geometry of the Compact SIMS, the AutoSIMS brings a very high level of automation to surface analysis with a typical user training period of under a day required to perform both surface, imaging and 3D depth profiles.