|File Size||2.88 MB|
|Create Date||4th October 2016|
Secondary ion mass spectrometry(SIMS) is a versatile, highly-sensitive technique for surface analysis and surface depth profiling of diverse materials. Hiden Analytical expands their primary system options to offer the choice of three initial equipment levels to suit a broad spread of budget capacities. All systems offer full UHV operation and expandability to the top-level specification. The dual-mode MAXIM mass spectrometer features operation both in the secondary ion mode and in the secondary neutral(SNMS) quantification mode.