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New – SIMS System Family Trio from Hiden

Oct 4, 2016

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  • Create Date October 4, 2016
  • Last Updated October 4, 2016

New - SIMS System Family Trio from Hiden

Secondary ion mass spectrometry(SIMS) is a versatile, highly-sensitive technique for surface analysis and surface depth profiling of diverse materials. Hiden Analytical expands their primary system options to offer the choice of three initial equipment levels to suit a broad spread of budget capacities. All systems offer full UHV operation and expandability to the top-level specification. The dual-mode MAXIM mass spectrometer features operation both in the secondary ion mode and in the secondary neutral(SNMS) quantification mode.