|File Size||3.65 MB|
|Create Date||4th October 2016|
Hiden Analytical announces a new range of surface and surface interface diagnostic tools. Based on the UHV Secondary Ion Mass Spectrometry (SIMS) technique the new tools provide for high performance surface elemental and contamination analysis together with depth profiling with nanometer scale depth resolution. Hiden surface diagnostics systems are designed to work well with many sample types including metallurgical thin films, coatings, solar cells, and semiconductors. Crucially the new systems include excellent depth and spatial resolution providing 3D images of the uppermost layers of surfaces and thin films on a nano/micron scale.