SIMS Surface Analysers with Potential

File Size281.08 KB
Create Date4th October 2016

Secondary ion mass spectrometry(SIMS) is a versatile, highly sensitive technique for compositional analysis of surfaces from the atomic level through to depths of 100’s of nanometres. Hiden Analytical extend their latest series of SIMS systems to offer the choice of equipment specification levels to suit a broad spread of budget capacities whilst maintaining the potential to subsequently expand to the top-level specification.