Hiden showcased the New Compact SIMS Instrument, a design breakthrough for surface analysis, & the QGA Atmospheric Gas Analyser at 61st AVS 9-14 November 2014, Baltimore MD, USA. Mark Buckley, Peter Hatton & Scott Ryan attended & exhibited on behalf of Hiden Analytical.
Peter Hatton presented a poster at AVS:
Download Poster : Improved Threshold Ionisation Mass Spectrometry
Scott Ryan (SR Associates), Peter Hatton (HIden Analytical Ltd. UK) & Mark Buckley (Hiden Inc, USA) attended & exhibited on behalf of Hiden Analytical Ltd, UK.
Peter Hatton talking to a Tim Hawley-Jones from UHV Design.
The Compact SIMS tool is designed for fast and easy characterisation of layer structures, surface contamination and impurities with sensitive detection of positive ions being assisted by the oxygen primary ion beam and provides isotopic sensitivity across the entire periodic table. The ion gun geometry is optimised to be ideal for nanometre depth resolution and near surface analysis.
In addition to SIMS, the Compact SIMS has an SNMS facility that is useful for quantification of high concentration elements, such as alloys.
– Solar cells
– Glass coatings
– Metallic thin films
– Small footprint
– Easy user friendly layout
– Positive SIMS and SNMS
– Depth Profiling
– 3D characterisation and imaging
– Mass spectra
– Isotopic analysis
– Analysis on the nanometre scale
Find out more about the Compact SIMS : Visit Product Page
Hiden also demonstrated their QGA Compact bench-top system for real time gas & vapour analysis. The Hiden QGA quantitative gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form. Inlet accessories are available to configure the system for sampling from low to high pressures, up to 30bar
Find out more about the QGA : Visit Product Page