This is a selection of the academic papers available, our collection of papers that include data measured using Hiden Analytical instruments continues to grow and gives an insight into the ways our instruments can be used.
Please contact us to request papers relevant to your application.
For the determination of surface composition, contaminant analysis and depth profiling.
Focused ion beam secondary ion mass spectrometry (FIB-SIMS) for high sensitivity nanoscale materials analysis
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