Analysis Solutions for your Plasma Research
Advance plasma research with precision tools for in-situ gas, ion and surface diagnostics. Hiden Analytical offers configurable solutions to characterise plasma species and energies, measure key electrical parameters, and link plasma conditions to thin-film growth and surface composition—combining EQP Series mass/energy analysis, ESPion advanced Langmuir probe measurements, and HPR-60 MBMS for neutrals, radicals and ions, alongside SIMS platforms for depth profiling and high-throughput surface analysis.
Our bespoke design service provides for development of solutions to meet specific requirements.
EQP Series – Systems for Plasma Research
High performance combined mass and energy quadrupole mass spectrometers for the characterisation of plasmas.
ESPion – Advanced Langmuir Probe
An advanced Langmuir probe featuring static and spatially resolved measurements of the primary electrical parameters of low pressure plasma.
HPR-60 MBMS – For analysis of neutrals, radicals and ions
The Hiden HPR-60 molecular beam mass spectrometer is a compact skimmer inlet MS for the analysis of atmospheric plasma and reactive gas phase intermediates.
SIMS Workstation
A UHV surface analysis system for thin film depth profiling
AutoSIMS – Automatic Surface Analysis System
A robust surface analysis solution for high throughput operations, the AutoSIMS can perform hundreds of processes a day without operator intervention.
Compact SIMS – A design breakthrough for surface analysis
Designed for fast and easy characterisation of layer structures, surface contamination and impurities with sensitive detection of positive ions being assisted by the oxygen primary ion beam and provides isotopic sensitivity across the entire periodic table.
Your Specific Application Requirements Addressed
From thin film and vacuum system studies to advanced materials characterisation, our team supports specification and integration of configured instrumentation for your research application.
