Thin Films, Plasma and Surface Engineering
Plasma Characterisation
Plasma characterisation, plasma ion analysers and langmuir probes.
Thin Film Optical Coating
Vacuum diagnostics and control of thin film coating processes.
Quadrupole Mass Spectrometers for Thin Films and Surface Engineering
Plasma characterisation, plasma ion analyzers and langmuir probes.
UHV Surface Science
For the determination of surface composition, contaminant analysis and for depth profiling.
FIB-SIMS for Nano-Scale Materials Analysis
Add high performance SIMS capability to your existing FIB system.
Plasma Deposition for Enhanced Surface Characteristics
Analytical systems for plasma deposition.
Plasma Etching and Atomic Layer Etching (ALE)
Monitor both the fluxes of radicals and ions and their energies in real time.
