Select Page

Thin Films, Plasma and Surface Engineering

Plasma Characterisation

Plasma characterisation, plasma ion analysers and langmuir probes.

Thin Film Optical Coating

Vacuum diagnostics and control of thin film coating processes.

Quadrupole Mass Spectrometers for Thin Films and Surface Engineering

Plasma characterisation, plasma ion analyzers and langmuir probes.

UHV Surface Science

For the determination of surface composition, contaminant analysis and for depth profiling.

FIB-SIMS for Nano-Scale Materials Analysis

Add high performance SIMS capability to your existing FIB system.