fbpx
Select Page

New – SIMS System Family Trio from Hiden

Secondary ion mass spectrometry(SIMS) is a versatile, highly-sensitive technique for surface analysis and surface depth profiling of diverse materials. Hiden Analytical expands their primary system options to offer the choice of three initial equipment levels to suit...

Caesium Ion Gun for SIMS

The Hiden IG5C high-brightness caesium ion gun produces an intense beam of caesium ions ideally suited to SIMS depth profiling, surface physics and surface modification for analysis of electronegative elements and MCs+ clusters, where M is the element of...

MIT Lincoln Labs Demonstration

On April 18, 2013 at MIT Lincoln Labs, in the cafeteria, Hiden Analytical will be demonstrating their latest instrument for atmospheric pressure gas analysis studies – the QGA Quantitative Gas Analysis System.