Secondary ion mass spectrometry(SIMS) is a versatile, highly-sensitive technique for surface analysis and surface depth profiling of diverse materials. Hiden Analytical expands their primary system options to offer the choice of three initial equipment levels to suit...
Hiden Analytical issue a new catalogue describing their mass spectrometer systems and microreactors for control and monitoring of diverse gas-related thermal processes. Application areas include catalyst quantification, thermogravimetric analysis(TGA), thermal...
The Hiden HPR-60 mass spectrometer is a research tool conceived specifically for direct analysis of ions, radicals and neutral species in reactive processes, and will be of interest to researchers in the fields of plasma and transient chemistry, reaction kinetics,...
The Hiden IG5C high-brightness caesium ion gun produces an intense beam of caesium ions ideally suited to SIMS depth profiling, surface physics and surface modification for analysis of electronegative elements and MCs+ clusters, where M is the element of...
On April 18, 2013 at MIT Lincoln Labs, in the cafeteria, Hiden Analytical will be demonstrating their latest instrument for atmospheric pressure gas analysis studies – the QGA Quantitative Gas Analysis System.
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