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A 5keV Caesium ion gun for UHV surface analysis applicationsThe IG5C features a low power, high brightness, surface ionization source coupled to a compact ion column, providing high performance in a small package. The gun is designed as a primary ion beam for all SIMS applications, dynamic, static and imaging.
Controlled via a windows PC based interface, which handles thermal management of the source, the gun is easy and reproducible to set up and can be configured for high current or small spot applications.
Diagnostic modes are instantly available with beam parameters (current and beam shape) measured on an electron suppressed Faraday collector and displayed live on the PC.
Drivers for LabVIEW are also available to permit OEM integration into other systems.
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