For the determination of surface composition, contaminant analysis and for depth profiling
The Hiden quadrupole mass spectrometers provide high sensitivity detection capability for the most demanding XHV/UHV vacuum environments. The pulse ion counting detector enables measurement of both positive and negative ions through 7 continuous decades, the integral accumulation mode being used for the capture of discreet particle events. Gating inputs and multi-channel analysis- MCA modes are included for pulsed molecular beam studies.
The Hiden IDP ion desorption probe is a quadrupole mass spectrometer configured for analysis of low energy ions in electron and photon stimulated desorption studies.
SIMS – for depth profiling, surface composition measurement, and elemental imaging, Hiden’s SIMS Workstation provides a complete analytical facility for surface science.