by hiden | Dec 8, 2014 | News & Press
New Customer Research Review: Mass Spectrometers for Plasma Characterisation [issue 1120/11] Hiden are pleased to announce the release of the new Customer Research Review. This issue focuses on Mass Spectrometers for Plasma Characterisation and features the Hiden EQP,...
by hiden | Dec 5, 2014 | News & Press
The Hiden QGA-series gas analysis systems feature direct real time multi-species analysis and quantification of gas and vapour related processes. Systems are highly adaptable with configurations suited to sampling directly from pressure regimes from 100 mbar through...
by hiden | Dec 4, 2014 | News & Press
The Hiden AutoSIMS is a self-contained, automated, SIMS tool for routine and repetitive surface analysis, ideal for the measurement of thin films, contamination and doping from the top monolayer to many microns in both conductive and insulating material. Samples are...
by hiden | Dec 3, 2014 | News & Press
Hiden Analytical’s QGA systems are suited for direct real-time analysis, quantification and control of gas related processes ranging in pressure from 100 mbar to 30 bar. The bench-top mass spectrometer systems are coupled to the user process by the integral...
by hiden | Dec 2, 2014 | News & Press
Thomas Gaudy, Hiden’s French representative, completed the installation of a HPR-30 for Vacuum Monitoring in Semiconductor Processing. HPR-30 Installation for Vacuum Monitoring in Semiconductor Processing, France Find out...
by hiden | Dec 1, 2014 | News & Press
The Hiden Compact SIMS/SNMS tool features full ultrahigh vacuum compatibility to address the requirement for fast, elemental surface characterisation of layer structures, contaminants and impurities. Typical application areas include semiconductor fabrications, glass...
