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Mass Spectrometers for Thin Films, Plasma & Surface Engineering

Hiden are pleased to announce the release of their New Customer Research Review. This issue [1120/09] focuses on Mass Spectrometers for Thin Films, Plasma & Surface Engineering & features the following Hiden Products:


EQP Plasma Sampling Mass Spectrometer

PSM Plasma Ion Analyser

EQS Bolt on SIMS Analyser

HPR-60 MBMS Molecular Beam Mass Spectrometer



Absolute Quantification of Deuterium Ion Fluxes. Project Summary by: A .Manhard, T. Schwarz-Selinger, and W. Jacob Max-Planck-Institute für Plasmaphysik, EURATOM Association, Boltzmannstr. 2, 85748 Garching, Germany  Read more


Ti and Al ion irradiation during Ti1-xAlxN alloy film growth. Project Summary by: G. Greczynski Department of Physics (IFM), Linköping University, SE-581 83 Linköping, Sweden Read more


Negative oxygen ion impingement on SiO2 thin films during growth. Project Summary by: A. Palmero Instituto de Ciencia de Materiales de Sevilla (CSIC/US), Avda. Américo Vespucio 49, 41092 Seville, Spain Read more


The origin of oxygen in oxide thin films. Project Summary by: Dr. Christof W. Schneider Paul Scherrer Institut, Materials Group, OFLBU111, General Energy Research Department, CH-5232 Villigen PSI, Switzerland Read more


Decomposition of Lignin from Sugarcane Bagasse. Project Summary by: J. Amorim Laboratório Nacional de Ciência e Tecnologia do Bioetanol CTBE/CNPEM, 13083-970, Campinas, São Paulo, Brazil Read more


Read more:

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