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Hiden Analytical Introduce the ToF-qSIMS Workstation

Hiden Analytical Introduce the ToF-qSIMS Workstation

The Hiden ToF-qSIMS Workstation uniquely combines both time-of-flight and quadrupole analysers in a single SIMS instrument.  The surface is where materials interact with the environment, where adhesion, deposition, corrosion and contamination occur and the ToF-qSIMS...
New Hiden Catalysis Applications Catalogue

New Hiden Catalysis Applications Catalogue

The new application brochure details some examples of the wide range of catalysis applications that Hiden Analytical products have been used for allowing the study of catalytic processes, from catalyst characterisation and development to reaction monitoring and...
New SIMS Applications Catalogue

New SIMS Applications Catalogue

Hiden Analytical introduce the SIMS applications catalogue. Originally developed for semiconductor applications, SIMS depth profiling provides ppm sensitivity and nanometre depth resolution; characterising the composition as a function of depth.  This powerful...
Thin Film Applications of the UHV-TPD Workstation

Thin Film Applications of the UHV-TPD Workstation

A successful method for investigating the microstructure of thin films by thermal effusion measurements is Temperature Programmed Desorption (TPD), also known as Thermal Desorption Spectrometry (TDS) or Thermal Desorption Analysis (TDA). Analysis by TPD involves...