Flexible Solar Cell
Depth profile through a Copper Indium Gallium Selenide (CIGS) solar cell showing high dynamic range and good depth resolution.
The depth scale is left as analytical cycles, showing that high data density can be achieved even when a large number of elements are detected. The overall depth is around 4 microns.
Related Products
The depth scale is left as analytical cycles, showing that high data density can be achieved even when a large number of elements are detected. The overall depth is around 4 microns.
Zinc in GaAs
Using caesium primary ions, the species of interest is measured as a molecule together with a Cs+ ion. For some elements, such as Zn, the ion ZnCs+ is actually more sensitive than detecting either Zn+ or Zn– ions.
FIB – SIMS | Focussed Ion Beam Secondary Ion Mass Spectrometry
Hiden Compact SIMS Mass Spectrometry in solid material
Hiden SIMS | Analytical Secondary Ion Mass Spectrometry Products
Low Energy Ne Scattering from Metal Surfaces using MARISS
High Five: UHV SIMS with Plasma Primary & Simultaneous Positive and Negative Secondary Ion Detection
Contaminant Analysis with Hiden Surface Analyzers
What is Surface Interface Analysis?
Mass Spectrometers for Silicon Semiconductor Analysis
Surface Analysis Products from Hiden Analytical
How to Analyse the Top Nano Layers of a Material
Electronic Structure and Catalytic Study of Solid Solutions of GaN in ZnO 48.00 KB 0 downloads
Electronic Structure and Catalytic Study of Solid Solutions of GaN in ZnO ...
Towards an Understanding of MCs+n Formation Mechanism in SIMS 1.94 MB 59 downloads
Towards an understanding of MCs+n formation mechanism in SIMS. ...
Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization... 330.25 KB 41 downloads
Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization...
Surface Analysis by Secondary-Ion Mass Spectroscopy During Etching with Gas-Cluster Ion Beam 153.58 KB 53 downloads
Surface analysis by secondary-ion mass spectroscopy during etching with gas-cluster...
Sputter Depth Profiling by Secondary Ion Mass Spectrometry Coupled with Sample Current... 613.21 KB 46 downloads
Sputter depth profiling by secondary ion mass spectrometry coupled with sample current...
Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS and... 109.76 KB 41 downloads
Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS...
Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective 1.94 MB 44 downloads
Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective. ...
Plasma Implanted Ultra Shallow Junction Boron Depth Profiles: Effect of Plasma Chemistry... 618.05 KB 48 downloads
Plasma implanted ultra shallow junction boron depth profiles: Effect of plasma chemistry...
Mass-Resolved Ion Scattering Spectrometry for Characterization of Samples with Historical... 200.29 KB 40 downloads
Mass-resolved ion scattering spectrometry for characterization of samples with historical...
