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Pharmaceuticals

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Identification of molecular signals using static SIMS on powders

SIMS can be used to confirm the presence of a drug or to make brand identification where different formulations exist

Overview

SIMS can be used to confirm the presence of a drug or to make brand identification where different formulations exist; a branded product may contain additional substances or a counterfeit product could show contamination.

The presence of binding, dehydrating or filling agents can also provide a unique fingerprint. In the example below, Al and Na come from the pill forming material. The high sensitivity of the analyser allows very low beam currents to be employed, keeping below the static SIMS limit preserves the high mass fragments required for unequivocal identification.

Powder Analysis

Powders may be analysed using SIMS, both for bulk composition and core-shell structure. Powders can be mounted using either conductive adhesive tape, dispersion, pill formation or pressing into indium sheet.

Further Reading

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Electronic Structure and Catalytic Study of Solid Solutions of GaN in ZnO 48.00 KB 0 downloads

Electronic Structure and Catalytic Study of Solid Solutions of GaN in ZnO ...
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Towards an Understanding of MCs+n Formation Mechanism in SIMS 1.94 MB 64 downloads

Towards an understanding of MCs+n formation mechanism in SIMS. ...
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Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization... 330.25 KB 46 downloads

Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization...
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Surface Analysis by Secondary-Ion Mass Spectroscopy During Etching with Gas-Cluster Ion Beam 153.58 KB 58 downloads

Surface analysis by secondary-ion mass spectroscopy during etching with gas-cluster...
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Sputter Depth Profiling by Secondary Ion Mass Spectrometry Coupled with Sample Current... 613.21 KB 51 downloads

Sputter depth profiling by secondary ion mass spectrometry coupled with sample current...
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Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS and... 109.76 KB 46 downloads

Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS...
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Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective 1.94 MB 49 downloads

Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective. ...
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Plasma Implanted Ultra Shallow Junction Boron Depth Profiles: Effect of Plasma Chemistry... 618.05 KB 53 downloads

Plasma implanted ultra shallow junction boron depth profiles: Effect of plasma chemistry...
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Mass-Resolved Ion Scattering Spectrometry for Characterization of Samples with Historical... 200.29 KB 45 downloads

Mass-resolved ion scattering spectrometry for characterization of samples with historical...
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Interfacial Diffusion in a Double Quantum Well Structure 1.94 MB 56 downloads

Interfacial diffusion in a double quantum well structure. ...