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Isotopically labelled material

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Being a mass spectrometry technique, SIMS can determine the isotopic composition of a material.

This is particularly useful when investigating diffusion within layers. 

Overview

Being a mass spectrometry technique, SIMS can determine the isotopic composition of a material. This is particularly useful when investigating diffusion within layers. Here a very sharp isotopically pure 54Fe layer is clearly defined with excellent depth resolution, grown within a thicker layer of natural isotopic abundance.

Nuclear fusion produces very high energy protons which implant in the reactor walls. Here SIMS has been used to detect deuterium implanted into tungsten as a simulation for the material effects in a fusion reactor wall.

Further Reading

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Electronic Structure and Catalytic Study of Solid Solutions of GaN in ZnO 48.00 KB 0 downloads

Electronic Structure and Catalytic Study of Solid Solutions of GaN in ZnO ...
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Towards an Understanding of MCs+n Formation Mechanism in SIMS 1.94 MB 45 downloads

Towards an understanding of MCs+n formation mechanism in SIMS. ...
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Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization... 330.25 KB 31 downloads

Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization...
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Surface Analysis by Secondary-Ion Mass Spectroscopy During Etching with Gas-Cluster Ion Beam 153.58 KB 41 downloads

Surface analysis by secondary-ion mass spectroscopy during etching with gas-cluster...
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Sputter Depth Profiling by Secondary Ion Mass Spectrometry Coupled with Sample Current... 613.21 KB 35 downloads

Sputter depth profiling by secondary ion mass spectrometry coupled with sample current...
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Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS and... 109.76 KB 29 downloads

Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS...
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Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective 1.94 MB 33 downloads

Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective. ...
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Plasma Implanted Ultra Shallow Junction Boron Depth Profiles: Effect of Plasma Chemistry... 618.05 KB 36 downloads

Plasma implanted ultra shallow junction boron depth profiles: Effect of plasma chemistry...
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Mass-Resolved Ion Scattering Spectrometry for Characterization of Samples with Historical... 200.29 KB 29 downloads

Mass-resolved ion scattering spectrometry for characterization of samples with historical...
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Interfacial Diffusion in a Double Quantum Well Structure 1.94 MB 39 downloads

Interfacial diffusion in a double quantum well structure. ...