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Isotopically labelled material

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Being a mass spectrometry technique, SIMS can determine the isotopic composition of a material.

This is particularly useful when investigating diffusion within layers. 

Overview

Being a mass spectrometry technique, SIMS can determine the isotopic composition of a material. This is particularly useful when investigating diffusion within layers. Here a very sharp isotopically pure 54Fe layer is clearly defined with excellent depth resolution, grown within a thicker layer of natural isotopic abundance.

Nuclear fusion produces very high energy protons which implant in the reactor walls. Here SIMS has been used to detect deuterium implanted into tungsten as a simulation for the material effects in a fusion reactor wall.

Further Reading

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Interface-Dominated Growth of a Metastable Novel Alloy Phase 1.94 MB 29 downloads

Interface-dominated Growth of a Metastable Novel Alloy Phase. ...
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Instantaneous Surface Work Function Dependence of MCs+n Molecular Ion Emission Under... 1.94 MB 24 downloads

Instantaneous surface work function dependence of MCs+n molecular ion emission under...
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Optimisation of the connection between TA-MS systems together with improved data interpretation for TA-MS applications. 1.98 MB 31 downloads

Optimisation of the connection between TA-MS systems together with improved data...
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High-temperature oxidation of CrN/AlN multilayer coatings. 605.40 KB 21 downloads

High-temperature oxidation of CrN/AlN multilayer coatings. ...
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Formation of a tetragonal Cu3Au alloy at gold/copper interfaces. 1.94 MB 21 downloads

Formation of a tetragonal Cu3Au alloy at gold/copper interfaces. ...
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Evidence of multiple H+ ion desorption pathways with ESD of chemisorbed and multilayer water. 2.35 MB 25 downloads

Evidence of multiple H+ ion desorption pathways with ESD of chemisorbed and multilayer...
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Energetics of MCsn+ molecular ions emitted from Cs+ irradiated surfaces. 207.58 KB 25 downloads

Energetics of MCsn+ molecular ions emitted from Cs+ irradiated surfaces. ...
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End point detection in ion beam milling of YB2 Cu3 07 thin films. 4.15 MB 27 downloads

End point detection in ion beam milling of YB2 Cu3 07 thin films. ...
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Dependence of scattered ion yield on the incident energy: Ne+ on pure gallium and indium. 252.94 KB 25 downloads

Dependence of scattered ion yield on the incident energy: Ne+ on pure gallium and...