Isotopically labelled material
Being a mass spectrometry technique, SIMS can determine the isotopic composition of a material.
This is particularly useful when investigating diffusion within layers.
Being a mass spectrometry technique, SIMS can determine the isotopic composition of a material. This is particularly useful when investigating diffusion within layers. Here a very sharp isotopically pure 54Fe layer is clearly defined with excellent depth resolution, grown within a thicker layer of natural isotopic abundance.
Nuclear fusion produces very high energy protons which implant in the reactor walls. Here SIMS has been used to detect deuterium implanted into tungsten as a simulation for the material effects in a fusion reactor wall.
FIB – SIMS | Focussed Ion Beam Secondary Ion Mass Spectrometry
Hiden Compact SIMS Mass Spectrometry in solid material
Hiden SIMS | Analytical Secondary Ion Mass Spectrometry Products
Low Energy Ne Scattering from Metal Surfaces using MARISS
High Five: UHV SIMS with Plasma Primary & Simultaneous Positive and Negative Secondary Ion Detection
Contaminant Analysis with Hiden Surface Analyzers
What is Surface Interface Analysis?
Mass Spectrometers for Silicon Semiconductor Analysis
Surface Analysis Products from Hiden Analytical
How to Analyse the Top Nano Layers of a Material
Key Contaminant Analysis Techniques