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Isotopically labelled material

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Being a mass spectrometry technique, SIMS can determine the isotopic composition of a material.

This is particularly useful when investigating diffusion within layers. 

Overview

Being a mass spectrometry technique, SIMS can determine the isotopic composition of a material. This is particularly useful when investigating diffusion within layers. Here a very sharp isotopically pure 54Fe layer is clearly defined with excellent depth resolution, grown within a thicker layer of natural isotopic abundance.

Nuclear fusion produces very high energy protons which implant in the reactor walls. Here SIMS has been used to detect deuterium implanted into tungsten as a simulation for the material effects in a fusion reactor wall.

Further Reading

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Combustion Synthesis of Triangular and Multifunctional ZnON (x # 0.15) Materials. 1.36 MB 25 downloads

Combustion Synthesis of Triangular and Multifunctional ZnON (x # 0.15) Materials. ...
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Characterization of TiO2 coatings prepared by a modified electric arc-physical vapour deposition system. 1.03 MB 28 downloads

Characterization of TiO2 coatings prepared by a modified electric arc-physical vapour...
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Application of Mass Resolved Ion Scattering, Secondary Ion Mass Spectrometry and Sample-Current Measurements for In Situ Depth Profiling of Thin Films. 4.15 MB 26 downloads

Application of Mass Resolved Ion Scattering, Secondary Ion Mass Spectrometry and...